US Patent Issued to REALTEK SEMICONDUCTOR on Nov. 3 for "Impedance transformation circuit and radio frequency power reliability test system" (Taiwanese Inventors)

ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,785,823, issued on Nov. 3, was assigned to REALTEK SEMICONDUCTOR CORP. (Hsinchu, Taiwan).

"Impedance transformation circuit and radio frequency power reliability test system" was invented by Chia-Hsiang Hsu (Hsinchu, Taiwan) and Chih-Chieh Wang (Hsinchu, Taiwan).

According to the abstract* released by the U.S. Patent & Trademark Office: "An impedance transformation circuit and a radio frequency power reliability test system are provided. The impedance transformation circuit can be used in a radio frequency power measurement system. The radio frequency power measurement system includes a signal generator, a buffer, a device under test, an attenuator, and a spectrum analyzer. The impeda...