US Patent Issued to RAKUTEN GROUP on April 14 for "Abnormality determination system, abnormality determination method, and program" (Japanese Inventors)

ALEXANDRIA, Va., April 15 -- United States Patent no. 12,602,278, issued on April 14, was assigned to RAKUTEN GROUP INC. (Tokyo).

"Abnormality determination system, abnormality determination method, and program" was invented by Daichi Hasegawa (Tokyo), Ryo Nishimura (Tokyo), Taisuke Fujii (Tokyo) and Kengo Fujioka (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "An abnormality determination system, comprising at least one processor configured to: acquire an index usable in abnormality determination about an occurrence of abnormality in a service providing system for providing a predetermined service; acquire plan data about a plan of the predetermined service; and execute the abnormality determination b...