US Patent Issued to Quantum-Si on May 13 for "Integrated sensor for lifetime characterization" (California, Connecticut Inventors)

ALEXANDRIA, Va., June 12 -- United States Patent no. 12,300,711, issued on May 13, was assigned to Quantum-Si Inc. (Branford, Conn.).

"Integrated sensor for lifetime characterization" was invented by Eric A.G. Webster (Santa Clara, Calif.), Changhoon Choi (Palo Alto, Calif.), Dajiang Yang (San Jose, Calif.), Xin Wang (San Jose, Calif.), Todd Rearick (Cheshire, Conn.), Kyle Preston (Guilford, Conn.), Ali Kabiri (Guilford, Conn.) and Gerard Schmid (Guilford, Conn.).

According to the abstract* released by the U.S. Patent & Trademark Office: "Aspects of the technology described herein relate to improved semiconductor-based image sensor designs. In some embodiments, an integrated circuit may comprise a photodetection region and a drain region ...