US Patent Issued to QUALCOMM on Sept. 9 for "Built-in self-test enhancements" (Indian Inventors)

ALEXANDRIA, Va., Sept. 10 -- United States Patent no. 12,411,171, issued on Sept. 9, was assigned to QUALCOMM Inc. (San Diego).

"Built-in self-test enhancements" was invented by Gaurav Verma (Noida, India) and Saksham Tandon (Bangalore, India).

According to the abstract* released by the U.S. Patent & Trademark Office: "Aspects of the present disclosure provide a method generally including obtaining one or more built-in self-test (BIST) patterns, each pattern including a series of instructions, applying a compression scheme to generate one or more compressed BIST patterns, wherein the compression scheme encodes an operation and data field of instructions to generate encoded instructions, each encoded instruction having an identifier (ID) f...