US Patent Issued to QUALCOMM on Nov. 3 for "Pattern selection for array puncturing" (American, Israeli Inventors)

ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,786,740, issued on Nov. 3, was assigned to QUALCOMM Inc. (San Diego).

"Pattern selection for array puncturing" was invented by Yavuz Yapici (Florham Park, N.J.), Igor Gutman (Hod HaSharon, Israel) and Junyi Li (Fairless Hills, Pa.).

According to the abstract* released by the U.S. Patent & Trademark Office: "Disclosed are systems and techniques for wireless communications. For instance, a process may include obtaining a message for transmission to a second apparatus; determining a time slot of a set of time slots for transmitting the message; determining a symbol of the time slot; determining a number of antenna elements of the first apparatus to disable; transmitting a beamformed tran...