US Patent Issued to QUALCOMM on July 7 for "Transceiver built-in self-test" (California, Texas Inventors)

ALEXANDRIA, Va., July 7 -- United States Patent no. 12,676,681, issued on July 7, was assigned to QUALCOMM Inc. (San Diego).

"Transceiver built-in self-test" was invented by Yunfei Feng (San Diego), Li Liu (San Diego), Chuan Wang (San Diego), Vahid Dabbagh Rezaei (San Diego), Vinod Panikkath (San Diego), Alaaeldien Mohamed Abdelrazek Medra (San Diego), Anosh Davierwalla (San Diego), Xinmin Yu (San Diego), Muhammad Hassan (San Diego), Wu-Hsin Chen (San Diego) and Sherif Hassan Kamel Embabi (Allen, Texas).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method of self-testing a transceiver integrated circuit substrate includes: providing a test signal to a transmission line that is communicatively coupled, or s...