US Patent Issued to QUALCOMM on July 21 for "Monitor circuit to determine integrated circuit condition based on diagnostic code sequence" (Canadian, American Inventors)

ALEXANDRIA, Va., July 21 -- United States Patent no. 12,688,349, issued on July 21, was assigned to QUALCOMM Inc. (San Diego).

"Monitor circuit to determine integrated circuit condition based on diagnostic code sequence" was invented by Anatoly Gelman (San Diego), Michael James Smith (Vancouver, Canada), James Cheng-Huan Wu (Vancouver, Canada), Olivier Alavoine (San Diego) and Amit Aneja (Chandler, Ariz.).

According to the abstract* released by the U.S. Patent & Trademark Office: "Aspects relate to monitoring timing margin of logic paths and its degradation through an integrated circuit. In one example an apparatus includes an integrated circuit having a logic path formed in the integrated circuit and a monitor circuit formed in the integ...