US Patent Issued to QUALCOMM on July 21 for "Cross link interference measurements by low-tier user equipment" (California Inventors)

ALEXANDRIA, Va., July 21 -- United States Patent no. 12,689,456, issued on July 21, was assigned to QUALCOMM Inc. (San Diego).

"Cross link interference measurements by low-tier user equipment" was invented by Huilin Xu (Temecula, Calif.), Yongjun Kwak (San Diego) and Muhammad Sayed Khairy Abdelghaffar (San Jose, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "Apparatuses and methods for cross link interference measurements by low-tier UEs are described. An apparatus is configured to obtain a CLI measurement based on a set of RBs associated with a DL channel from a network node. The set of RBs includes one of (1) less than a total number of RBs configured for a signal strength CLI measurement or (2) at ...