US Patent Issued to QUALCOMM on Jan. 20 for "Techniques for measuring self-interference in full duplex wireless communications" (Israeli Inventors)

ALEXANDRIA, Va., Jan. 20 -- United States Patent no. 12,531,644, issued on Jan. 20, was assigned to QUALCOMM Inc. (San Diego).

"Techniques for measuring self-interference in full duplex wireless communications" was invented by Shay Landis (Hod Hasharon, Israel), Idan Michael Horn (Hod Hasharon, Israel) and Yehonatan Dallal (Kfar Saba, Israel).

According to the abstract* released by the U.S. Patent & Trademark Office: "Aspects described herein relate to defining gaps within a time period for measuring self-interference due to clutter. The gaps can be defined for a device to measure self-interference caused by reflection of the signal, or may be specified by a network node to cause the device to refrain from transmitting so the network node...