US Patent Issued to QUALCOMM on Jan. 20 for "Interference measurement per subband per Tx beam for combination of FDM and MU-MIMO" (California Inventors)

ALEXANDRIA, Va., Jan. 20 -- United States Patent no. 12,532,340, issued on Jan. 20, was assigned to QUALCOMM Inc. (San Diego).

"Interference measurement per subband per Tx beam for combination of FDM and MU-MIMO" was invented by Hamed Pezeshki (San Diego), Tao Luo (San Diego), Arumugam Chendamarai Kannan (San Diego) and Yan Zhou (San Diego).

According to the abstract* released by the U.S. Patent & Trademark Office: "Aspects presented herein provide for improved measurement and management of interference for different subbands and different Tx beams for communication with the UEs. A UE may be configured to receive scheduling for communication with a base station in a first beam direction using a first subband. The UE may be configured to m...