US Patent Issued to QUALCOMM on Feb. 3 for "Cross-link interference measurement over multiple beams" (American, Chinese Inventors)

ALEXANDRIA, Va., Feb. 3 -- United States Patent no. 12,542,617, issued on Feb. 3, was assigned to QUALCOMM Inc. (San Diego).

"Cross-link interference measurement over multiple beams" was invented by Huilin Xu (Temecula, Calif.), Qunfeng He (San Diego) and Yuwei Ren (Beijing).

According to the abstract* released by the U.S. Patent & Trademark Office: "Methods, systems, and devices for wireless communications are described. Generally, a base station may configure one or more cross-link interference measurement resources on which a user equipment (UE) is to measure CLI. The UE may measure CLI from a single aggressor UE in multiple receive directions. The UE may identify receive beams on which it receives other signal types, and use those rec...