US Patent Issued to QUALCOMM on Aug. 4 for "Delay element gain calibration" (California Inventors)

ALEXANDRIA, Va., Aug. 5 -- United States Patent no. 12,700,867, issued on Aug. 4, was assigned to QUALCOMM Inc. (San Diego).

"Delay element gain calibration" was invented by Yunliang Zhu (San Diego) and Yiwu Tang (San Diego).

According to the abstract* released by the U.S. Patent & Trademark Office: "Certain aspects of the present disclosure are directed towards a method for delay element calibration. The method generally includes: incrementing a calibration delay control signal provided to a delay element to generate an output clock signal by delaying an input clock signal; comparing, via a phase detector (PD), the input clock signal and the output clock signal to generate a PD output signal; and accumulating, via a first accumulator, th...