US Patent Issued to QUALCOMM Incorportated on Sept. 8 for "Criterion and conformance test for eligibility of sensing beams for channel access" (American, Chinese Inventors)

ALEXANDRIA, Va., Sept. 8 -- United States Patent no. 12,732,900, issued on Sept. 8, was assigned to QUALCOMM Incorportated (San Diego).

"Criterion and conformance test for eligibility of sensing beams for channel access" was invented by Vinay Chande (San Diego), Jing Sun (San Diego), Arumugam Chendamarai Kannan (San Diego), Giovanni Chisci (San Diego), Siyi Chen (Beijing), Mohammed Ali Mohammed Hirzallah (San Marcos, Calif.), Aleksandar Damnjanovic (Del Mar, Calif.), Xiaoxia Zhang (San Diego) and Tao Luo (San Diego).

According to the abstract* released by the U.S. Patent & Trademark Office: "Certain aspects of the present disclosure provide techniques for determining if a first sensing beam is eligible for use in channel sensing by a devi...