US Patent Issued to Qorvo US on Oct. 27 for "On-chip capacitance measurement method and apparatus" (Dutch, American Inventors)

ALEXANDRIA, Va., Oct. 27 -- United States Patent no. 12,775,036, issued on Oct. 27, was assigned to Qorvo US Inc. (Greensboro, N.C.).

"On-chip capacitance measurement method and apparatus" was invented by Alexandru Aurelian Ciubotaru (Coconut Creek, Fla.) and Jeroen Kuenen (Beuningen, Netherlands).

According to the abstract* released by the U.S. Patent & Trademark Office: "An on-chip capacitance measurement method and associated systems and devices are provided. Embodiments described herein rely on using the capacitor under test in an on-chip relaxation oscillator configuration whose charging/discharging currents, supply voltage, and output frequency are measured individually in a measurement block. The voltage thresholds of the relaxatio...