ALEXANDRIA, Va., July 28 -- United States Patent no. 12,693,264, issued on July 28, was assigned to Qnami AG (Muttenz, Switzerland).

"Detection of magnetization inhomogeneities in ultra-scaled magnetic nanowires" was invented by Patrick Maletinsky (Zurich, Switzerland), Hai Zhong (Freiburg, Germany) and Felipe Favaro De Oliveira (Augst, Switzerland).

According to the abstract* released by the U.S. Patent & Trademark Office: "The invention concerns a method for nonperturbative detection of one or more magnetic inhomogeneities resulting from nano-defects in a single longitudinal anisotropic magnetic sample structure having a nanometric cross-sectional dimension. A solid-state lattice with a single spin defect is used for magnetometry assess...