ALEXANDRIA, Va., Feb. 24 -- United States Patent no. 12,560,646, issued on Feb. 24, was assigned to ProGrAnalog Corp. (Portland, Ore.).

"Form factor equivalent load testing device" was invented by Roger Beeston (Camas, Wash.), Christopher Poach (West Linn, Ore.) and David Baretich (Aurora, Ore.).

According to the abstract* released by the U.S. Patent & Trademark Office: "An electronic load testing system is configured to emulate aspects of an integrated circuit (IC). A control module of the system is configured to be electrically coupled to a first location on a printed circuit board (PCB) of an electronic assembly, and a load module is configured to be electrically coupled to a second location on the PCB. The load module includes a load ...