US Patent Issued to PRECITEC OPTRONIK on Oct. 27 for "Method and device for measuring optical thickness" (German Inventors)

ALEXANDRIA, Va., Oct. 27 -- United States Patent no. 12,774,882, issued on Oct. 27, was assigned to PRECITEC OPTRONIK GMBH (Neu-Isenburg, Germany).

"Method and device for measuring optical thickness" was invented by Stephan WeiB (Rodgau, Germany), Philipp Nimtsch (GieBen, Germany), Tobias Beck (Heusenstamm, Germany) and Christoph Dietz (Obertshausen, Germany).

According to the abstract* released by the U.S. Patent & Trademark Office: "An optical thickness measuring device includes a light source, a measuring head, an optical spectrometer with an optical component for spectrally splitting an input light, a detector, and an evaluation device. The light source is optically connected to the measuring head and is configured to generate an at l...