US Patent Issued to Pratt & Whitney Canada on Feb. 17 for "Adaptive component overhaul using structured light scan data" (Texas Inventors)

ALEXANDRIA, Va., Feb. 17 -- United States Patent no. 12,551,974, issued on Feb. 17, was assigned to Pratt & Whitney Canada Corp. (Longueuil, Canada).

"Adaptive component overhaul using structured light scan data" was invented by Kevin M. Tracy (Wichita Falls, Texas) and Charles Trent Daulton (Burkburnett, Texas).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method of overhaul is provided. During this overhaul method, a substrate is scanned using structured light to provide substrate scan data. The substrate is from a component previously installed within an engine. The substrate scan data is compared to substrate reference data to provide additive manufacturing data. Material is deposited with the substrat...