US Patent Issued to Powerchip Semiconductor Manufacturing on July 15 for "Failure analysis and detection method for memory" (Taiwanese Inventors)

ALEXANDRIA, Va., July 16 -- United States Patent no. 12,362,035, issued on July 15, was assigned to Powerchip Semiconductor Manufacturing Corp. (Hsinchu, Taiwan).

"Failure analysis and detection method for memory" was invented by Chingching Shih (Hsinchu County, Taiwan) and Jen-Hao Chuang (New Taipei, Taiwan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A failure analysis and detection method for a memory is configured to perform abnormal bit detection on a memory. The failure analysis and detection method includes: coordinates are marked on a detection area of the memory, and the coordinates are associated with layout design or a process of the detection area; a MOD function is used to perform classificati...