ALEXANDRIA, Va., Feb. 24 -- United States Patent no. 12,562,235, issued on Feb. 24, was assigned to Powerchip Semiconductor Manufacturing Corp. (Hsinchu, Taiwan).
"Testing method and testing system" was invented by Tsai-Ko Teng (Hsinchu, Taiwan) and Yu Chih Yeh (Hsinchu, Taiwan).
According to the abstract* released by the U.S. Patent & Trademark Office: "Disclosed are a testing method and a testing system. The testing method is configured to scan a three-dimensional memory chip. The three-dimensional memory chip includes a plurality of memory chips stacked with each other. The testing method includes: dividing each memory chip into a plurality of memory blocks; testing each memory block to detect a total failed first signal line quantity ...