US Patent Issued to Piezo-Metrics on April 21 for "Rosette strain gage and method of fabrication" (California, New York Inventors)

ALEXANDRIA, Va., April 21 -- United States Patent no. 12,607,526, issued on April 21, was assigned to Piezo-Metrics Inc (Simi Valley, Calif.).

"Rosette strain gage and method of fabrication" was invented by Franklin Curtis Wong (Simi Valley, Calif.), Robert Andrew Mueller (Simi Valley, Calif.) and Stephen Gilbert Gonya (Binghamton, N.Y.).

According to the abstract* released by the U.S. Patent & Trademark Office: "The teachings of the present disclosure enable rosette strain gages that can be cost-effectively produced in high volume with substantially uniform performance. Rosette strain gages in accordance with the present disclosure comprise a plurality of semiconductor strain gages that are sculpted from a device layer of a semiconductor...