US Patent Issued to Park Systems on March 24 for "Measurement system with detection mechanism and method of operation thereof" (California Inventors)

ALEXANDRIA, Va., March 24 -- United States Patent no. 12,584,942, issued on March 24, was assigned to Park Systems Corp. (Suwon, South Korea).

"Measurement system with detection mechanism and method of operation thereof" was invented by Hanaul Noh (Mountain View, Calif.), Chih-Chieh Hsieh (San Jose, Calif.), Myunghoon Choi (Santa Clara, Calif.) and Stefan Kaemmer (Santa Barbara, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method of operation of a measurement system includes: generating a microwave excitation towards a sample; scanning the sample along a path at a first vertical position relative to the sample; capturing a first microwave response along the path at the first vertical position base...