ALEXANDRIA, Va., Feb. 24 -- United States Patent no. 12,558,743, issued on Feb. 24, was assigned to PANASONIC INTELLECTUAL PROPERTY MANAGEMENT Co. LTD. (Osaka, Japan).
"Bead appearance inspection device and bead appearance inspection system" was invented by Toshinari Mohri (Osaka, Japan), Shoriki Narita (Osaka, Japan), Katsuaki Okuma (Osaka, Japan) and Takamichi Komatsu (Osaka, Japan).
According to the abstract* released by the U.S. Patent & Trademark Office: "A bead appearance inspection device includes an acquisition unit that acquires input data related to a welding bead, a storage unit that stores a first determination standard and a second determination standard used for an inspection of a defect of the welding bead, a first determin...