ALEXANDRIA, Va., March 3 -- United States Patent no. 12,566,208, issued on March 3, was assigned to Orbotech Ltd. (Yavne, Israel).
"Pulsed laser micro LED inspection" was invented by Arie Glazer (Mevaseret, Israel).
According to the abstract* released by the U.S. Patent & Trademark Office: "The system includes a laser generator, an antenna, and a processor to distinguish the photovoltaic radio frequency signals emitted by defective LEDs and functioning LEDs in a contactless manner. The laser generator emits a pulsed laser beam toward an LED. The LED generates a photovoltaic radio frequency signal when radiated by the pulsed laser beam. The antenna receives the photovoltaic radio frequency signal generated by the LED. The processor is in e...