US Patent Issued to Optum on March 17 for "Evaluation score determination machine learning models with differential periodic tiers" (Indian Inventor)

ALEXANDRIA, Va., March 17 -- United States Patent no. 12,579,452, issued on March 17, was assigned to Optum Inc. (Minnetonka, Minn.).

"Evaluation score determination machine learning models with differential periodic tiers" was invented by Shyam Charan Mallena (Telangana, India).

According to the abstract* released by the U.S. Patent & Trademark Office: "Various embodiments of the present invention address technical challenges associated with performing machine learning operations on timeseries/periodic data by introducing a machine learning framework that has a first periodic tier for determining predicted evaluation scores for those predictive entities that are associated with a single evaluation period (e.g., a single year of data) and...