US Patent Issued to OMRON on Oct. 14 for "Optical measurement device and optical measurement method" (Japanese Inventors)

ALEXANDRIA, Va., Oct. 21 -- United States Patent no. 12,442,922, issued on Oct. 14, was assigned to OMRON Corp. (Kyoto, Japan).

"Optical measurement device and optical measurement method" was invented by Yosuke Kajii (Ayabe, Japan) and Tomonori Kondo (Kyoto, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "Without requiring that threshold values be set for each measurement condition, the present invention makes it possible to determine whether noise that can occur in measured values is present. An optical measurement device acquires measured values on the basis of the amount of reflected light that is received after being reflected by a target. The optical measurement device comprises a setting part for ...