ALEXANDRIA, Va., Feb. 17 -- United States Patent no. 12,555,218, issued on Feb. 17, was assigned to OMRON Corp. (Kyoto, Japan).
"Classification condition setting support apparatus" was invented by Koichi Ekawa (Kyoto, Japan) and Saori Yasui (Muko, Japan).
According to the abstract* released by the U.S. Patent & Trademark Office: "Provided is a classification condition setting support apparatus including: a basic information storage unit configured to store basic information including basic imaging information and a basic defect type; a classification condition setting unit; a basic defect type classification unit configured to classify the basic imaging information according to the classification condition; a classification result confirm...