ALEXANDRIA, Va., May 12 -- United States Patent no. 12,628,450, issued on May 12, was assigned to OmniVision Technologies Inc. (Santa Clara, Calif.).
"Defect prevention methods for pixel-array substrates" was invented by Qin Wang (San Jose, Calif.) and Gang Chen (San Jose, Calif.).
According to the abstract* released by the U.S. Patent & Trademark Office: "A method for preventing defects in a thin film deposited on a semiconductor substrate includes forming a plurality of trenches on a periphery-region of the semiconductor substrate to yield a trenched surface. The semiconductor substrate includes a pixel array; the periphery-region surrounds the pixel array. The trenched surface includes (i) a plurality of trench regions each forming a r...