US Patent Issued to Olum Material on Sept. 22 for "Semiconductor test device and semiconductor test system" (South Korean Inventors)

ALEXANDRIA, Va., Sept. 24 -- United States Patent no. 12,742,794, issued on Sept. 22, was assigned to Olum Material Corp. (Yongin-si, South Korea).

"Semiconductor test device and semiconductor test system" was invented by Taek Yong Jang (Seongnam-si, South Korea), Jae Seob Lee (Seoul, South Korea), Woo Suk Choi (Hanam-si, South Korea) and Mu Gyeom Kim (Pyeongtaek-si, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "Provided are a semiconductor test device and a semiconductor test system. The semiconductor test device for testing an electrical connection of a semiconductor includes a membrane portion including a first surface and a plurality of aperture patterns extending toward a direction of a sec...