US Patent Issued to Ofinno on Oct. 27 for "No reference image quality assessment based decoder side intra prediction" (Virginia Inventors)

ALEXANDRIA, Va., Oct. 27 -- United States Patent no. 12,777,177, issued on Oct. 27, was assigned to Ofinno LLC (Reston, Va.).

"No reference image quality assessment based decoder side intra prediction" was invented by Tae Meon Bae (McLean, Va.), Esmael Hejazi Dinan (McLean, Va.) and Kalyan Goswami (Reston, Va.).

According to the abstract* released by the U.S. Patent & Trademark Office: "A decoder may receive, for a block, an indication that an intra prediction mode is to be determined at the decoder to decode the block. The decoder may generate, based on the indication, a plurality of reconstructed blocks for a plurality of intra prediction modes. Each of the plurality of reconstructed blocks is generated based on a prediction block gener...