US Patent Issued to Ofinno on March 31 for "Beam failure measurements of overlapping reference signals" (Virginia Inventors)

ALEXANDRIA, Va., March 31 -- United States Patent no. 12,592,763, issued on March 31, was assigned to Ofinno LLC (Reston, Va.).

"Beam failure measurements of overlapping reference signals" was invented by Ali Cagatay Cirik (Chantilly, Va.), Yunjung Yi (Vienna, Va.), Esmael Hejazi Dinan (McLean, Va.) and Hua Zhou (Vienna, Va.).

According to the abstract* released by the U.S. Patent & Trademark Office: "A wireless device may receive one or more radio resource control (RRC) configuration parameters indicating: one or more beam detection sets; and identifiers of two reference signals (RSs). During at least one symbol in which the two RSs overlap, the wireless device may measure for beam failure: both of the two RSs based on the two RSs being ...