US Patent Issued to NXP USA on Aug. 25 for "System having single-event latch-up detection and mitigation" (Texas Inventors)

ALEXANDRIA, Va., Aug. 25 -- United States Patent no. 12,719,478, issued on Aug. 25, was assigned to NXP USA Inc. (Austin, Texas).

"System having single-event latch-up detection and mitigation" was invented by Mohamed Suleman Moosa (Austin, Texas), Gary Edwin Anderson II (Austin, Texas), Mehul D. Shroff (Austin, Texas), George Walter Lange (Austin, Texas) and Antoine Fabien Dubois (Austin, Texas).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method of detecting and mitigating an SEL is provided. The method includes measuring a current of a first circuit block of a semiconductor device and determining that the measured current exceeds a first threshold. In response to the measured current exceeding the first...