US Patent Issued to NXP USA on Aug. 25 for "System and method for fault detection in sensors" (Indian Inventors)

ALEXANDRIA, Va., Aug. 25 -- United States Patent no. 12,716,798, issued on Aug. 25, was assigned to NXP USA INC. (Austin, Texas).

"System and method for fault detection in sensors" was invented by Bodh Raj Gautam (Solan, India) and Vikram Varma (Noida, India).

According to the abstract* released by the U.S. Patent & Trademark Office: "A sensing circuit is coupled to a sensor comprising first and second sensing elements. The sensing circuit detects changes in physical parameters by determining change in attributes of first and second sensing elements. The sensing circuit may include a switching circuit, first and second test elements, and a converter. During a normal mode, the switching circuit couples the first and second sensing elements...