US Patent Issued to NXP on Sept. 8 for "Electrochemical sensor measurement unit" (Dutch, Indian Inventors)

ALEXANDRIA, Va., Sept. 8 -- United States Patent no. 12,730,089, issued on Sept. 8, was assigned to NXP B.V. (Eindhoven, Netherlands).

"Electrochemical sensor measurement unit" was invented by Rinze Ida Mechtildis Peter Meijer (Herkenbosch, Netherlands) and Pramod Rajan Kesavelu Shekar (Bangalore, India).

According to the abstract* released by the U.S. Patent & Trademark Office: "An electrochemical sensor measurement unit is described including a sensor degradation signature unit and a processing unit coupled to the sensor degradation signature unit. The processing unit includes a processor first input configured to be coupled to a sensor output of an electrochemical sensor and a processor first output configured to be coupled to a sensor...