ALEXANDRIA, Va., July 15 -- United States Patent no. 12,663,468, issued on June 23, was assigned to NXP B.V. (Eindhoven, Netherlands).
"System and method for detecting faults in integrated circuits" was invented by Jorge Ernesto Perez Chamorro (Preverenges, Switzerland), Vasudev Srinivasan (Mysuru, India), Andreas Lentz (Buchholz, Germany) and Jean-Michel Cioranesco (Schenefeld, Germany).
According to the abstract* released by the U.S. Patent & Trademark Office: "A fault detection system includes a state register, an error detection code (EDC) register, logic circuitry, an EDC generator, and an EDC checker. The state and EDC registers store first reference data and first checksum data, respectively. The logic circuitry executes a logic fu...