ALEXANDRIA, Va., Feb. 17 -- United States Patent no. 12,557,604, issued on Feb. 17, was assigned to NXP B.V. (Eindhoven, Netherlands).
"Degradation circuit" was invented by Henri Verhoeven (Someren, Netherlands), Edwin Schapendonk (Oss, Netherlands), Matheus Johannus Gerardus Lammers (Nederweert, Netherlands) and Oswald Moonen (Eindhoven, Netherlands).
According to the abstract* released by the U.S. Patent & Trademark Office: "One example discloses a degradation circuit, including: a first structure configured to be coupled to an integrated circuit (IC); a second structure, coupled to the first structure, and configured to be coupled to the IC; wherein together the first and second structures form a degradation detection element; and a co...