ALEXANDRIA, Va., Feb. 11 -- United States Patent no. 12,546,813, issued on Feb. 10, was assigned to NXP B.V. (Eindhoven, Netherlands).
"Built-in self-test system and method for crystal oscillator amplifier" was invented by Siyaram Sahu (Bari Raisen, India), Anand Kumar Sinha (Noida, India) and Ateet Omer (Kanpur, India).
According to the abstract* released by the U.S. Patent & Trademark Office: "A BIST system and method for a crystal oscillator amplifier including current mirror circuitry, an ADC, a DAC, and test control circuitry. The amplifier includes a current source, a base transistor and a feedback resistor. The ADC converts a self-bias voltage on an input node into a digital bias code during a normal mode when the current source is...