US Patent Issued to NXP on Dec. 2 for "SAR ADC with bottom-plate sampling and mismatch error shaping" (Dutch, American Inventors)

ALEXANDRIA, Va., Dec. 2 -- United States Patent no. 12,489,453, issued on Dec. 2, was assigned to NXP B.V. (Eindhoven, Netherlands).

"SAR ADC with bottom-plate sampling and mismatch error shaping" was invented by Michael Todd Berens (Austin, Texas), Alphons Litjes (Zijtaart, Netherlands) and Erik Olieman (Waalre, Netherlands).

According to the abstract* released by the U.S. Patent & Trademark Office: "A SAR ADC includes a DAC, a comparator and SAR circuitry, where the DAC includes MSBs encoded with first capacitors; a mismatch error shaping capacitor coupled to the MSBs; LSBs encoded with second capacitors, where a first switch set couples bottom capacitor plates of the first capacitors and the mismatch error shaping capacitor to receive ...