US Patent Issued to NXP on Aug. 11 for "Jitter applied detection for semiconductor secure element" (German, Indian Inventors)

ALEXANDRIA, Va., Aug. 12 -- United States Patent no. 12,707,982, issued on Aug. 11, was assigned to NXP B.V. (Eindhoven, Netherlands).

"Jitter applied detection for semiconductor secure element" was invented by Kurt Ulrich Neugebauer (Vaterstetten, Germany), Nicolas Louis Bernard Nabor Hemmerle (Munich), Devesh Pratap Singh (Bijnor, India) and Younes Benlakhouy (Grasbrunn, Germany).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method for jitter applied detection for a semiconductor secure element including generating a test waveform comprising a test pulse. The test waveform is modulated with an inductive loop coupled to a secure element and to an Electromagnetic (EM) signal to generate an observed wavefor...