US Patent Issued to NVIDIA on Feb. 24 for "Efficient pixel density measurement of stitched images" (California Inventors)

ALEXANDRIA, Va., Feb. 24 -- United States Patent no. 12,561,938, issued on Feb. 24, was assigned to NVIDIA Corp. (Santa Clara, Calif.).

"Efficient pixel density measurement of stitched images" was invented by Animesh Khemka (Fremont, Calif.) and Nikhil Krishna Parab (Fremont, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "A first synthetic image including a first pattern and a second synthetic image including a second pattern are processed to generated a stitched image comprising a modified version of the first synthetic image and a modified version of the second synthetic image. One or more features of the first pattern are deformed in the modified version of the first synthetic image and one or more...