ALEXANDRIA, Va., Oct. 27 -- United States Patent no. 12,775,761, issued on Oct. 27, was assigned to Nuvoton Technology Corp. (Hsinchu, Taiwan).

"Integrated circuit with FIB-ready structures" was invented by Yuval Kirschner (Even Yehuda, Israel).

According to the abstract* released by the U.S. Patent & Trademark Office: "An Integrated Circuit (IC), designed for debugging by Focused Ion Beam (FIB) editing, includes functional circuitry, a network of Basic FIB elements (BFEs), and routing circuitry. The functional circuitry includes functional nodes. Each of the BFEs includes a respective metal pad configured to be connected to one of the functional nodes using FIB editing. The routing circuitry is configured to route one or more selected BF...