US Patent Issued to NuFlare Technology on May 12 for "Drawing data examination method for examining drawing data of a figure expressed by a B-spline curve, drawing method, drawing apparatus, and non-transitory storage medium" (Japanese Inventor)

ALEXANDRIA, Va., May 12 -- United States Patent no. 12,626,428, issued on May 12, was assigned to NuFlare Technology Inc. (Yokohama, Japan).

"Drawing data examination method for examining drawing data of a figure expressed by a B-spline curve, drawing method, drawing apparatus, and non-transitory storage medium" was invented by Kenichi Yasui (Kawasaki, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A drawing data examination method acquires coordinates representing the positions of a first control point group forming a B-spline curve; calculates a B-spline curve intersection ratio; converts the coordinates of the first control point group into the coordinates of a second control point group of a Bezier...