ALEXANDRIA, Va., March 31 -- United States Patent no. 12,590,911, issued on March 31, was assigned to Nuctech Co. Ltd. (Beijing) and Tsinghua University (Beijing).
"Inspection system and inspection method" was invented by Li Zhang (Beijing), Zhiqiang Chen (Beijing), Qingping Huang (Beijing), Hui Ding (Beijing), Yong Zhou (Beijing), Xin Jin (Beijing) and Liming Yao (Beijing).
According to the abstract* released by the U.S. Patent & Trademark Office: "An inspection system, including: a carrying device; at least one ray source and a detector assembly. When the at least one ray source is located at one of scanning positions relative to the carrying device, the at least one ray source and the detector assembly are lifted or lowered along the r...