US Patent Issued to NUCTECH, Tsinghua University on July 14 for "Inspection system and method" (Chinese Inventors)

ALEXANDRIA, Va., July 14 -- United States Patent no. 12,681,205, issued on July 14, was assigned to NUCTECH COMPANY Ltd. (Beijing) and Tsinghua University (Beijing).

"Inspection system and method" was invented by Li Zhang (Beijing), Zhiqiang Chen (Beijing), Qingping Huang (Beijing), Hui Ding (Beijing), Yong Zhou (Beijing), Xin Jin (Beijing) and Liming Yao (Beijing).

According to the abstract* released by the U.S. Patent & Trademark Office: "An inspection system and method, the inspection system includes: a carrying device, at least one ray source, where each ray source includes a separate housing to define a vacuum space and a plurality of target spots enclosed within the housing; and a detector assembly. The at least one ray source and t...