US Patent Issued to NTT on Sept. 15 for "Learning apparatus, anomaly detection apparatus, learning method, anomaly detection method, and program" (Japanese Inventors)

ALEXANDRIA, Va., Sept. 15 -- United States Patent no. 12,737,624, issued on Sept. 15, was assigned to NTT Inc. (Tokyo).

"Learning apparatus, anomaly detection apparatus, learning method, anomaly detection method, and program" was invented by Yoichi Matsuo (Tokyo) and Kengo Tajiri (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "A learning apparatus according to one embodiment includes an input unit configured to input a normal data collection for a first system that is a target domain and to input a normal data collection for a second system that is a source domain. The learning apparatus includes a learning unit configured to train a model that includes a first autoencoder configured to input normal da...