US Patent Issued to NTT on Oct. 6 for "Training device to learn data and generate a model calculating an anomaly score, training method, and training program" (Japanese Inventor)

ALEXANDRIA, Va., Oct. 6 -- United States Patent no. 12,755,191, issued on Oct. 6, was assigned to NTT Inc. (Tokyo).

"Training device to learn data and generate a model calculating an anomaly score, training method, and training program" was invented by Yuki Yamanaka (Musashino, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A generation unit learns data selected as unlearned data among learning data and generates a model calculating an anomaly score. A selection unit selects, as unlearned data, at least some of data in which an anomaly score calculated by the model generated by the generation unit is equal to or greater than a threshold among the learning data."

The patent was filed on Sept. 18, 2020,...