ALEXANDRIA, Va., March 31 -- United States Patent no. 12,588,839, issued on March 31, was assigned to NTT INC. (Tokyo).
"Component concentration measuring device" was invented by Yujiro Tanaka (Tokyo), Daichi Matsunaga (Tokyo), Masahito Nakamura (Tokyo) and Michiko Seyama (Tokyo).
According to the abstract* released by the U.S. Patent & Trademark Office: "A first holding member and a second holding member are arranged so as to sandwich a measurement site of a measurement subject, and are capable of clamping the measurement site. A light beam emitted from a light emitting unit is guided to the first holding member by an optical fiber, passes through an optical system, is reflected by a reflection unit, and is then incident on the measureme...