ALEXANDRIA, Va., July 15 -- United States Patent no. 12,663,338, issued on June 23, was assigned to NTT Inc. (Tokyo).
"Optical reflectometry device and method" was invented by Shingo Ono (Musashino, Japan).
According to the abstract* released by the U.S. Patent & Trademark Office: "The present disclosure is a light reflection measurement device including: a first light source for outputting first continuous light; a second light source for outputting second continuous light as local light; and a signal processing unit for performing digital signal processing on a light reception signal I(t) obtained by multiplexing reflected light that is obtained by irradiating a measurement target with one branched light of the first continuous light, r...