US Patent Issued to NTT on Aug. 11 for "Optical path testing device and optical path testing method" (Japanese Inventors)

ALEXANDRIA, Va., Aug. 12 -- United States Patent no. 12,704,403, issued on Aug. 11, was assigned to NTT Inc. (Tokyo).

"Optical path testing device and optical path testing method" was invented by Hiroshi Takahashi (Musashino, Japan), Yoshifumi Wakisaka (Musashino, Japan), Daisuke Iida (Musashino, Japan) and Yusuke Koshikiya (Musashino, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "An optical path testing device and an optical path testing method divide output light from a laser light source into a probe optical path and a local optical path and convert modulated light obtained by modulating input light of the probe optical path into probe light including pulsed light, generate a beat signal by causing...