ALEXANDRIA, Va., April 21 -- United States Patent no. 12,608,632, issued on April 21, was assigned to NTT Inc. (Tokyo).
"Error detection device, error detection method, and error detection program" was invented by Maya Okawa (Tokyo) and Hiroyuki Toda (Tokyo).
According to the abstract* released by the U.S. Patent & Trademark Office: "An object is to make it possible to accurately detect abnormality of event data.A training unit (105) trains a parameter of a model based on a plurality of event series that are event data in a time series and labels that indicate abnormality or normality with respect to event data of each of the plurality of event series, the model outputting a degree of abnormality of a target event series when the target e...